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Author Nguyen, T. P. ♦ Lapkowski, M. ♦ Jonnard, P. ♦ Vergand, F. ♦ Staub, P. ♦ Bonnelle, C. ♦ Tran, V. H.
Sponsorship USDOE
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword PHYSICS ♦ POLYPHENYLS ♦ INFRARED SPECTRA ♦ VINYL RADICALS ♦ CHROMIUM ♦ THIN FILMS ♦ X-RAY SPECTROSCOPY ♦ SURFACE COATING ♦ EMISSION SPECTRA ♦ BINDING ENERGY
Abstract We have studied the interface formed on polyparaphenylene-vinylene (PPV) thin film by chromium layer deposited by thermal evaporation. Comparison of attenuated total reflection infra-red spectra obtained in pristine and covered PPV films shows that new absorption bands emerge at 687, 1026 and 1392 cm{sup {minus}1} upon chromium deposition. The Cr 3d valence distributions obtained by electron induced x-ray emission spectroscopy with covered sample is shifted towards higher binding energies with regards to metallic chromium. The features found in both experiments are interpreted as the characteristics of a compound in the chromium on polymer interface. {copyright} {ital 1996 American Institute of Physics.}
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-01-01
Publisher Place United States
Volume Number 354
Issue Number 1
Technical Publication No. CONF-950119-


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