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Author Dreiske, P. ♦ Carmody, M. ♦ Grein, C. H. ♦ Zhao, J. ♦ Bommena, R. ♦ Kilbourne, C. A. ♦ Kelley, R. ♦ McCammon, D. ♦ Brandl, D.
Source SpringerLink
Content type Text
Publisher Springer US
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword MBE ♦ HgCdTe ♦ HgTe ♦ x-ray ♦ calorimetry ♦ calorimeters ♦ MCT on Si ♦ zero-gap HgCdTe ♦ CdTe ♦ CdZnTe ♦ Solid State Physics ♦ Electronics and Microelectronics, Instrumentation ♦ Characterization and Evaluation of Materials ♦ Optical and Electronic Materials
Abstract Arrays of x-ray microcalorimeters will enable broadband, high-resolution x-ray spectroscopy to study and substantiate black holes, dark matter, and other celestial phenomenon. At EPIR we continue to achieve growth of high-quality, low-doped, single-crystal HgCdTe, and HgTe epilayers on Si and CdZnTe to be employed by NASA in these instruments. Excellent low-temperature heat capacities (with no significant electronic term) have been demonstrated in integrated devices, with both HgTe and HgCdTe showing improvement over the HgTe used previously. Goal resolutions ≤4 eV have been achieved with good yield for both HgTe and HgCdTe.
ISSN 03615235
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-06-18
Publisher Place Boston
e-ISSN 1543186X
Journal Journal of Electronic Materials
Volume Number 39
Issue Number 7
Page Count 10
Starting Page 1087
Ending Page 1096

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Source: SpringerLink