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Author Egorov, E. V. ♦ Egorov, V. K.
Source SpringerLink
Content type Text
Publisher SP MAIK Nauka/Interperiodica
File Format PDF
Copyright Year ©2009
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword Surfaces and Interfaces, Thin Films
Abstract Characteristics of planar X-ray waveguide resonators (PXWRs) including the low total intensity of the beams they form are briefly discussed. Simple methods for the light gathering power enhancements are described. Experimental data characterizing some of the methods are presented. According to these data, equipping a PXWR with an input tapered total-external-reflection concentrator is presumably the most promising way to enhance the light gathering power of the resonator. It has been experimentally shown that the use of a symmetric tapered concentrator increases the light gathering power of the PXWR at least five times without distortion of the spatial intensity distribution of the X-ray beam formed by the resonator. The results of the implementation for the modified PXWR for diffraction analysis are presented.
ISSN 10274510
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-02-26
Publisher Place Dordrecht
e-ISSN 18197094
Journal Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number 3
Issue Number 1
Page Count 7
Starting Page 41
Ending Page 47

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Source: SpringerLink