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Author Djuzhev, N. A. ♦ Yurov, A. S. ♦ Preobrazhensky, R. Yu. ♦ Mazurkin, N. S. ♦ Chinenkov, M. Yu.
Source SpringerLink
Content type Text
Publisher Pleiades Publishing
File Format PDF
Copyright Year ©2016
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword anisotropic magnetoresistive sensor ♦ magnetization-reversal process ♦ mathematical modeling ♦ Surfaces and Interfaces, Thin Films
Abstract The specific features of numerical calculation of the magnetization-reversal process in thin-film components with large linear dimensions and a complex topology in relation to magnetoresistive transducers (sensors) are considered. The calculated value of the sensor sensitivity obtained within the framework of a uniform and micromagnetic magnetization-reversal model is compared with experimental data. Calculations of the magnetization-reversal process within the framework of the micromagnetic model show the positive effect of edge magnetization pinning which is manifested in the mutual compensation of current and magnetization- distribution nonuniformities; it can be used to enhance the sensitivity of anisotropic magnetoresistive (AMR) sensors.
ISSN 10274510
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2016-05-15
Publisher Place Moscow
e-ISSN 18197094
Journal Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number 10
Issue Number 2
Page Count 5
Starting Page 307
Ending Page 311


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Source: SpringerLink