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Author Mouzali, S. ♦ Lefebvre, S. ♦ Rommeluère, S. ♦ Ferrec, Y. ♦ Primot, J.
Source SpringerLink
Content type Text
Publisher Springer US
File Format PDF
Copyright Year ©2016
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword HgCdTe ♦ IRFPA ♦ spectral response ♦ fixed pattern noise ♦ cutoff wavelength ♦ cadmium composition ♦ Optical and Electronic Materials ♦ Characterization and Evaluation of Materials ♦ Electronics and Microelectronics, Instrumentation ♦ Solid State Physics
Abstract Mercury cadmium telluride (HgCdTe) is one of the most commonly used material systems for infrared detection. The performance of infrared focal-plane arrays (IRFPAs) based on this material is limited by several noise sources. In this paper, we focus on the fixed pattern noise, which is related to disparities between the spectral responses of pixels. In our previous work, we showed that spectral nonuniformities in a HgCdTe IRFPA were caused by inhomogeneities of thickness and cadmium composition in the HgCdTe layer, using an optical description of the pixel structure. We propose to use this bidimensional dependence combined with experimental spectral responses to estimate disparities of thickness and cadmium composition in a specific HgCdTe-based IRFPA. The estimation methods and the resulting maps are presented, highlighting the accuracy of this nondestructive method.
ISSN 03615235
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2016-05-17
Publisher Place New York
e-ISSN 1543186X
Journal Journal of Electronic Materials
Volume Number 45
Issue Number 9
Page Count 5
Starting Page 4607
Ending Page 4611


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Source: SpringerLink