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Author Krishnamurthy, S. ♦ Berding, M. A. ♦ Robinson, H. ♦ Sher, A.
Source SpringerLink
Content type Text
Publisher Springer-Verlag
File Format PDF
Copyright Year ©2006
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Chemistry & allied sciences
Subject Keyword Current-voltage (I-V) curve ♦ HgCdTe ♦ long-wavelength infrared ♦ piezoelectric effect ♦ trap-assisted tunneling ♦ Optical and Electronic Materials ♦ Characterization and Evaluation of Materials ♦ Electronics and Microelectronics, Instrumentation ♦ Solid State Physics and Spectroscopy
Abstract We have generalized the existing expression for the trap-assisted tunneling current to include the effect of linearly varying electric field in the depletion region and self-consistently calculated steady-state trap occupation probability. We find that the magnitude and variation of current with voltage depend critically on these improvements.
ISSN 03615235
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2006-01-01
Publisher Place New York
e-ISSN 1543186X
Journal Journal of Electronic Materials
Volume Number 35
Issue Number 6
Page Count 4
Starting Page 1399
Ending Page 1402

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Source: SpringerLink