1,1-Dimethylhydrazine as a high purity nitrogen source for MOVPE-water reduction and quantification using nuclear magnetic resonance, gas chromatography-atomic emission detection spectroscopy and cryogenic-mass spectroscopy analytical techniques1,1-Dimethylhydrazine as a high purity nitrogen source for MOVPE-water reduction and quantification using nuclear magnetic resonance, gas chromatography-atomic emission detection spectroscopy and cryogenic-mass spectroscopy analytical techniques

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 Author Odedra, R. ♦ Smith, L. M. ♦ Rushworth, S. A. ♦ Ravetz, M. S. ♦ Clegg, J. ♦ Kanjolia, R. ♦ Irvine, S. J. C. ♦ Ahmed, M. U. ♦ Bourret Courchesne, E. D. ♦ Li, N. Y. ♦ Cheng, J. Source SpringerLink Content type Text Publisher Springer-Verlag File Format PDF Copyright Year ©2000 Language English
 Subject Domain (in DDC) Natural sciences & mathematics ♦ Chemistry & allied sciences Subject Keyword Hydrazines ♦ dimethylhydrazine ♦ MOVPE ♦ nitrogen source ♦ Optical and Electronic Materials ♦ Characterization and Evaluation of Materials ♦ Electronics and Microelectronics, Instrumentation ♦ Solid State Physics and Spectroscopy Abstract Hydrazine derivatives are attractive low temperature nitrogen sources for use in MOVPE due to their low thermal stability. However their purification and subsequent analysis has not previously been investigated in depth for this application. A detailed study on 1,1-dimethylhydrazine {(CH$_{3}$)$_{2}$N-NH$_{2}$} purified by eight different methods and the subsequent quantitative measurements of water present in the samples obtained is reported here. A correlation between $^{1}$H nuclear magnetic resonance spectroscopy (NMR), gas chromatography-atomic emission detection (GC-AED) and cryogenic mass spectroscopy (Cryogenic-MS) has been performed. All three analysis techniques can be used to measure water in the samples and with the best purification the water content can be lowered well below 100 ppm. The high purity of this material has been demonstrated by growth results and the state-of-the-art performance of laser diodes. ISSN 03615235 Age Range 18 to 22 years ♦ above 22 year Educational Use Research Education Level UG and PG Learning Resource Type Article Publisher Date 2000-01-01 Publisher Place New York e-ISSN 1543186X Journal Journal of Electronic Materials Volume Number 29 Issue Number 1 Page Count 4 Starting Page 161 Ending Page 164