### Study of resonant tunneling in Au nanoclusters on the surface of SiO$_{2}$/Si thin films using the combined scanning tunneling microscopy and atomic-force microscopy techniqueStudy of resonant tunneling in Au nanoclusters on the surface of SiO$_{2}$/Si thin films using the combined scanning tunneling microscopy and atomic-force microscopy technique

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 Author Lapshina, M. A. ♦ Filatov, D. O. ♦ Antov, D. A. ♦ Barantsev, N. S. Source SpringerLink Content type Text Publisher SP MAIK Nauka/Interperiodica File Format PDF Copyright Year ©2009 Language English
 Subject Domain (in DDC) Technology ♦ Engineering & allied operations Subject Keyword Surfaces and Interfaces, Thin Films Abstract The morphology and electronic properties of Au nanoclusters on the surface of SiO$_{2}$ thin films on n $^{+}$-Si substrates are studied using the combined scanning tunneling microscopy (STM) and atomic-force microscopy (AFM) technique. The peaks associated with the resonant tunneling of electrons from the states of the valence band of the probe material to the states of the conduction band of the substrate material through Au nanoclusters are observed on the current-voltage characteristics for the contact of a p $^{+}$-Si AFM probe with Au nanoclusters. Experimental results are interpreted by calculating the tunnel transparency of the SiO$_{2}$/Au/SiO$_{2}$ double barrier structure in a strong electric field. ISSN 10274510 Age Range 18 to 22 years ♦ above 22 year Educational Use Research Education Level UG and PG Learning Resource Type Article Publisher Date 2009-08-13 Publisher Place Dordrecht e-ISSN 18197094 Journal Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques Volume Number 3 Issue Number 4 Page Count 7 Starting Page 559 Ending Page 565