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Author Lapshina, M. A. ♦ Filatov, D. O. ♦ Antov, D. A. ♦ Barantsev, N. S.
Source SpringerLink
Content type Text
Publisher SP MAIK Nauka/Interperiodica
File Format PDF
Copyright Year ©2009
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword Surfaces and Interfaces, Thin Films
Abstract The morphology and electronic properties of Au nanoclusters on the surface of SiO$_{2}$ thin films on n $^{+}$-Si substrates are studied using the combined scanning tunneling microscopy (STM) and atomic-force microscopy (AFM) technique. The peaks associated with the resonant tunneling of electrons from the states of the valence band of the probe material to the states of the conduction band of the substrate material through Au nanoclusters are observed on the current-voltage characteristics for the contact of a p $^{+}$-Si AFM probe with Au nanoclusters. Experimental results are interpreted by calculating the tunnel transparency of the SiO$_{2}$/Au/SiO$_{2}$ double barrier structure in a strong electric field.
ISSN 10274510
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-08-13
Publisher Place Dordrecht
e-ISSN 18197094
Journal Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number 3
Issue Number 4
Page Count 7
Starting Page 559
Ending Page 565


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Source: SpringerLink