Access Restriction

Source CiteSeerX
Content type Text
File Format PDF
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword X-ray Diffraction Characterization ♦ Shot Peening ♦ Residual Stress Pmduced ♦ X-ray Diffraction Method ♦ Residual Stress ♦ Peened Material ♦ Unique Ability ♦ Practical Application ♦ Residual Stress Distribution ♦ Brief Overview ♦ X-ray Diffraction Residual Stress Measurement ♦ Non-destructive Surface Residual Stress Measurement ♦ Nickel Base Alloy ♦ Quality Control ♦ Complete Description ♦ Subsurface Residual Stress Distribution ♦ Macroscopic Residual Stress
Abstract Dr. A. Niku-Lari. First published by IITT-International, A brief overview of the theory and practice of x-ray diffraction residual stress measurement as applied to shot peened materials is presented. The unique ability of x-ray diffraction methods to determine both the macroscopic residual stress and the depth and magnitude of the cold worked layer produced by shot peening is described. The need to obtain a complete description of the subsurface residual stress distribution, in order to accurately characterize the residual stress distributions produced by shot peening, is emphasized. Non-destructive surface residual stress measurements are shown to generally be inadequate to reliably characterize the residual stresses produced by shot peening. Practical applications of x-ray diffraction methods for quality control testing are considered. Examples are presented for steel and nickel base alloys.
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research
Education Level UG and PG ♦ Career/Technical Study