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Author Zykov, Andrey ♦ Veciana, Gustavo De
Source CiteSeerX
Content type Text
File Format PDF
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Density-reliability Tradeoff ♦ Reliable Device ♦ Nanoscale Substrate ♦ Design Hierarchy ♦ Traditional Hierarchical Design ♦ Interconnect Fabric ♦ Reliability Requirement ♦ Increased Device Density ♦ Integrated System ♦ Design Scaling Factor ♦ Several Interesting Question ♦ Hier-archical Design ♦ Increased Device Density Density-reliability Tradeoff ♦ Analysis Reveals ♦ High Performance System ♦ Critical Parameter ♦ Nanoscale Regime ♦ Different Level ♦ High Performance ♦ Basic Fault-tolerance Technique ♦ Simple Assumption ♦ Simplied Model ♦ Salient Feature ♦ Eventual Benet
Abstract It is widely recognized that device and interconnect fabrics at the nanoscale will be character-ized by an increased susceptibility to transient faults. This appears to be intrinsic to nanoscale regimes and fundamentally limits the eventual benets of the increased device density, i.e., the overheads associated with achieving fault-tolerance may counter the benets of increased device density density-reliability tradeoff. At the same time, as devices scale down one can expect a higher proportion of area to be associated with interconnection, i.e., area is wire dominated. This paper theoretically explores density-reliability tradeoffs in wire dominated integrated systems. We derive an area scaling model based on simple assumptions capturing the salient features of hier-archical design for high performance systems. We then evaluate overheads associated with using basic fault-tolerance techniques at different levels of the design hierarchy. This, albeit simplied model, allows us to tackle several interesting questions: When does it make sense to use smaller less reliable devices? At what scale of the design hierarchy should fault tolerance be applied in high performance integrated systems? Our analysis reveals two critical parameters, the technology and design scaling factors, which are key to predicting the reliability requirements for emerging technologies if traditional hierarchical design continues to be used. 1
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research
Education Level UG and PG ♦ Career/Technical Study
Learning Resource Type Article