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Author Wood, W. M. ♦ Nichols, J. E.
Source CiteSeerX
Content type Text
File Format PDF
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Long-term Information Archiving ♦ Color Analog ♦ Compositional Change ♦ Second Order Importance ♦ Thin Film System ♦ Robust Material ♦ Accurate Prediction ♦ Material Reflective ♦ Diffractive Property ♦ Variable Diffraction Efficiency ♦ Optical Behaviour ♦ Diffractive Structure ♦ Ion Implantation Effect ♦ Sub-micron Feature Size ♦ Ion Deposition ♦ Digital Image ♦ Material Optical Property ♦ Text Archiving ♦ Post Milling ♦ Optical Thin Film Structure ♦ Focused Ion Beam
Abstract We have demonstrated the use of selective, reproducible, milling of sub-micron feature sizes by focused ion beam of optical thin film structures made from robust materials for color and B&W, analog and digital image and text archiving. This method has also been used to create diffractive structures with controlled, variable diffraction efficiencies. Modeling of the material optical properties, both pre- and post- milling, has enabled accurate prediction of material reflective, transmissive, and diffractive properties, and has effectively shown that ion implantation effects, such as compositional changes and ion deposition, are of second order importance to the optical behaviour of the thin film system.
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research
Education Level UG and PG ♦ Career/Technical Study