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Author Sosey, M.
Source CiteSeerX
Content type Text
File Format PDF
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Abstract A study of the frequency and location of the NICMOS bad pixels in each of the three cameras had not been undertaken since the instrument was commissioned on-board HST in 1997. The original MASKFILEs located in the calibration database (CDBS) were compiled with data taken during Systems Level Thermal Vacuum (SLTV) ground testing in August 1996. This analysis examined dark frames taken during the initial lifetime of NIC-MOS, March 1997- January 1999, and details the creation of new bad pixel masks for each camera. Updated flat field reference files were also created as a result of this analysis.
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research
Education Level UG and PG ♦ Career/Technical Study
Publisher Date 2002-01-01