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Author Jezersek, David
Source CiteSeerX
Content type Text
File Format PDF
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword External Beamline ♦ Rb Method ♦ Depth Resolution
Abstract in He atmosphere was made at MIC. Resulting spectra are of comparable 1 quality with spectra collected in vacuum. Depth resolution With an RBS method we can easily detect layers of heavier elements on the substrate of lighter elements and determine its thickness.
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research
Education Level UG and PG ♦ Career/Technical Study
Publisher Institution Jožef Stefan Institute