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Author Patel, Janak H. ♦ Lumetta, Steven S.
Source CiteSeerX
Content type Text
File Format PDF
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Test Generator ♦ Several Different Combination ♦ Hardware Compactor ♦ Saluja-karpovsky Compactors ♦ Many Unknown ♦ Error Detection ♦ Small Number ♦ Small Tester Memory ♦ Expected Response ♦ Unknown Logic ♦ Non-proprietary Code ♦ Test Response ♦ Well-known Error Detection ♦ Correction Code ♦ Saluja-karpovsky Space Compactors ♦ Output Pin ♦ Required Error Detection Capability ♦ Bit Error
Description Proc. IEEE VLSI Test Symp
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research
Education Level UG and PG ♦ Career/Technical Study
Learning Resource Type Article
Publisher Date 2003-01-01