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Author Boldyš, J. ♦ Hrach, R.
Source CiteSeerX
Content type Text
File Format PDF
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Image Analysis ♦ Semicontinuous Metal Film ♦ Mathematical Morphology ♦ Thin Film Growth ♦ Thin Film Structure Description ♦ Semicontinuous Film ♦ Film Micrographs ♦ Experimental Photograph ♦ Physical Mechanism ♦ Computer Experimentation ♦ Irregular Object ♦ Direct Monte Carlo Simulation Technique ♦ Haar Wavelet Transform ♦ Basic Algorithm ♦ Atomistic Model ♦ Discontinuous Metal Film ♦ New Set
Abstract In this paper the morphology of discontinuous metal films with irregular objects and semicontinuous films is studied by a combination of computer experimentation and image analysis of film micrographs. For the discussion of physical mechanisms which take part during thin film growth, an atomistic model based on direct Monte Carlo simulation technique was performed. For the analysis of experimental photographs, as well as simulated micrographs, the basic algorithms of mathematical morphology are used. Inadittion it is proposed a new set of features for thin film structure description, which are based on coefficients of Haar wavelet transform. 1.
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research
Education Level UG and PG ♦ Career/Technical Study
Learning Resource Type Article