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Author Yasufuku, H. ♦ Ibe, T. ♦ Okumura, M. ♦ Kera, S. ♦ Okudaira, K. K. ♦ Harada, Y. ♦ Ueno, N.
Sponsorship (US)
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Publisher The American Physical Society
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ DEPOSITION ♦ DIFFUSION ♦ ELECTRON EMISSION ♦ ELECTRON MICROSCOPY ♦ MICROSCOPY ♦ ORGANIC SEMICONDUCTORS ♦ PHOTOEMISSION ♦ PHTHALOCYANINES ♦ PHYSICS ♦ THIN FILMS
Abstract Diffusion of a large organic semiconductor molecule, chloroaluminum phthalocyanine (ClAlPc), on a cleaved MoS{sub 2} surface was detected using photoemission electron microscopy (PEEM) and metastable electron emission microscopy (MEEM). The PEEM and MEEM images showed that a micropattern of ClAlPc ultrathin film prepared on the MoS{sub 2} surface by vacuum deposition shrinks with time and finally disappears even at room temperature at which the molecules do not evaporate. The results indicate that control of molecular diffusion is necessary for the preparation of stable micro or nanostructure of organic thin films. {copyright} 2001 American Institute of Physics.
ISSN 00218979
Educational Use Research
Learning Resource Type Article
Publisher Date 2001-07-01
Publisher Place United States
Journal Journal of Applied Physics
Volume Number 90
Issue Number 1


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