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Author Liliental-Weber, Z. ♦ Cherns, David
Sponsorship (US)
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Publisher The American Physical Society
Language English
Subject Keyword MATERIALS SCIENCE ♦ BURGERS VECTOR ♦ DISLOCATIONS ♦ EDGE DISLOCATIONS ♦ MICROSTRUCTURE ♦ OPTICAL PROPERTIES ♦ PHYSICS ♦ POINT DEFECTS ♦ SHEAR ♦ STRESSES ♦ TRANSMISSION ELECTRON MICROSCOPY
Abstract Transmission electron microscopy study of plan-view and cross-section samples of epitaxial laterally overgrown (ELOG) GaN samples is described. Two types of dislocation with the same type of Burgers vector but different line direction have been observed. It is shown that threading edge dislocations bend to form dislocation segments in the c plane as a result of shear stresses developed in the wing material along the stripe direction. It is shown that migration of these dislocations involves both glide and climb. Propagation of threading parts over the wing area is an indication of high density of point defects present in the wing areas on the ELOG samples. This finding might shed light on the optical properties of such samples. {copyright} 2001 American Institute of Physics.
ISSN 00218979
Educational Use Research
Learning Resource Type Article
Publisher Date 2001-06-15
Publisher Place United States
Journal Journal of Applied Physics
Volume Number 89
Issue Number 12


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