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Author Dhruv, Davit ♦ Joshi, Zalak ♦ Gadani, Keval ♦ Boricha, Hetal ♦ Pandya, D. D. ♦ Solanki, P. S. ♦ Shah, N. A. ♦ Joshi, A. D.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ ATOMIC FORCE MICROSCOPY ♦ CALCIUM ADDITIONS ♦ DOPED MATERIALS ♦ ELECTRIC CONDUCTIVITY ♦ ELECTRIC CONTACTS ♦ FILMS ♦ MAGNETIC FIELDS ♦ MANGANATES ♦ MONOCRYSTALS ♦ SPIN ♦ SPIN-ON COATING ♦ SUBSTRATES ♦ SURFACES ♦ TEMPERATURE DEPENDENCE ♦ YTTRIUM COMPOUNDS
Abstract In this communication, we report the rectifying properties observed across the junction, consists of Ca{sup +2} doped hexagonal YMnO{sub 3} manganite film, grown on n-type (100) Si single crystalline substrate. The junction was grown using cost effective chemical solution deposition (CSD) technique by employing spin coating method. Surface morphology of Y{sub 0.9}5Ca{sub 0.05}MnO{sub 3}/Si (YCMO/Si) film was carried out by atomic force microscopy and magnetic response of film was studied by magnetic force microscopy. Current – voltage characteristics of the junction was carried out by using Keithley source meter in current perpendicular to plane (CPP) mode at different temperatures. Rectification in I – V behavior has been observed for the junction at all the temperatures studied. With increase in temperature, rectification ratio, in the range of 10{sup 4}, increases across the junction. Results have been discussed in the context of thermal effects.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2016-05-06
Publisher Place United States
Volume Number 1728
Issue Number 1


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