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Author Yang, S. I. ♦ Suh, Y. D. ♦ Jin, S. M. ♦ Kim, S. K. ♦ Park, J. ♦ Shin, E. J. ♦ Kim, D.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ PHYSICS ♦ CHEMISTRY ♦ FULLERENES ♦ PHOTOLUMINESCENCE ♦ EMISSION SPECTRA ♦ TEMPERATURE DEPENDENCE ♦ RELAXATION ♦ DYNAMICS ♦ EXCITED STATES
Abstract The time-resolved photoluminescence (PL) of C{sub 60} solid film was measured at various detection wavelengths, excitation laser fluences, and temperatures. Two emission bands were identified which possess different decay profiles, and these profiles exhibited completely opposite temperature dependence. The bands were attributed to free exciton states and self-trapped exciton states, which decay through diffusive recombination and activated intersystem crossing, respectively. For the latter case, a distinct rise component in the PL time profile was observed at low temperature. This strongly suggests that there exists a non-negligible barrier between the free exciton states and self-trapped exciton states. 25 refs.
ISSN 00223654
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-05-30
Publisher Place United States
Journal Journal of Physical Chemistry
Volume Number 100
Issue Number 22


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