Thumbnail
Access Restriction
Open

Author Neumann, Oliver ♦ Brüggemann, Rudolf ♦ Bauer, Gottfried H. ♦ Hariskos, Dimitrios ♦ Witte, Wolfram
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ CHEMICAL COMPOSITION ♦ DIFFRACTION ♦ FERMI LEVEL ♦ FLUCTUATIONS ♦ GRAIN BOUNDARIES ♦ INTEGRALS ♦ OPTICAL MICROSCOPES ♦ PHOTOLUMINESCENCE ♦ POLYCRYSTALS ♦ RECOMBINATION ♦ ROUGHNESS ♦ SURFACES
Abstract We analyze Cu(In,Ga)Se{sub 2} absorbers with a scanning near-field optical microscope (SNOM) by photoluminescence (PL). Such measurements allow one to extract local fluctuations of the integral PL yield, the quasi-Fermi level splitting, and the material composition in the submicron range. However, the experimental findings depend strongly on the surface roughness of the absorber: If the surface is rough, artifact-prone correlations between surface contour and PL features measured by SNOM can be found that complicate the study of recombination effects. For smooth surfaces, such correlations no longer exist and the influence of grain boundaries on the integral PL yield and the quasi-Fermi level splitting is revealed. The method also allows a detailed determination of the local band gaps in neighboring grains and their spatial variation inside, and thus of possibly local changes in chemical composition of different grains.
ISSN 00218979
Educational Use Research
Learning Resource Type Article
Publisher Date 2015-11-14
Publisher Place United States
Journal Journal of Applied Physics
Volume Number 118
Issue Number 18


Open content in new tab

   Open content in new tab